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State of the Art Surface Analysis Techniques

State of the Art Equipment

ACCESS state-of-the-art surface analysis techniques including X-ray spectroscopy spectrometer (XPS), Auger electron spectroscopy (AES) and Time of Flight Secondary Ion Mass Spectrometry (ToFSIMS), together with some of the World’s leading Experts to help you solve all your industrial material problems.

Surface Analysis Experts

Surface AnalysisThe Midlands Surface Analysis Team has over 30 years experience in surface analysis working closely with industrial partners from the Automotive, Aerospace, Medical Device, Semi-conductor and Packaging Industries. They use the complete range of techniques including XPS, AES and ToFSIMS to solve some of industries most difficult problems in for example stress/failure analysis, contamination, adhesion-failure, corrosion, and biocompatibility issues.

Surface analysis is concerned with the measurement of compositional, chemical and physical properties of the first few atomic layers of a material. These outermost layers have a profound effect on the properties and the performance of materials in a wide range of technologies. XPS, Auger and ToFSIMS can be applied to virtually all materials including metals, glasses, ceramics and polymers and in the study of processes such as catalysis, adhesion, corrosion, diffusion, oxidation, segregation, surface contamination and tribological interactions.

The use of this state-of-the-art equipment (XPS, AES and ToFSIMS) provide the ultimate in sensitivity, spatial resolution and energy resolution which together with the very latest data collection and processing computer systems allow unequalled unequivocal and accurate analysis of surfaces and surface interactions.

Our range-of-techniques are available at competitive prices with rapid turnaround and sample throughput, together with detailed data interpretation and high quality imaging and mapping if required.

For further information, please contact info@midsurfanalysis.co.uk or telephone +44 (0)121 204 3530 or alternatively please complete our analysis request form and a consultant will be in contact.